Characterization of ultrashort terawatt laser pulses by spatially encoded SPIDER technique
Romanovskii Y. O.1, Mitrofanov A. V.2,3,4, Shcheglov P. A.4, Nazarov M. M.4, Sidorov-Biryukov D. A.1,2,4
1Moscow State University, Moscow, Russia
2Russian Quantum Center, Skolkovo, Moscow, Russia
3Institute on Laser and Information Technologies—Branch of the Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Shatura, Moscow region, Russia
4National Research Center “Kurchatov Institute”, Moscow, Russia
Email: romanovskii.io17@physics.msu.ru

PDF
Terawatt laser pulses obtained after temporal compression due to nonlinear spectrum broadening in thin glass plates with subsequent dispersion compensation by chirped mirrors are experimentally characterized by spatially encoded spectral phase interferometry. The proposed method allowed to reconstruct the spectral and temporal phase of obtained 16 fs laser pulses with up to 20 mJ of energy in a single-shot mode with spatial resolution. Keywords: ultrashort femtosecond pulses, spectrum broadening in transparent dielectrics, spatially encoded spectral phase interferometry. DOI: 10.61011/EOS.2023.02.55787.9-23
  1. A.M. Zheltikov. Sverkhkorotkie impulsy i metody nelineinoi optiki (Fizmatlit, 2006) (in Russian)
  2. E.A. Khazanov. Quantum Elect., 52 (3), 208 (2022). DOI: 10.1070/QEL18001
  3. T. Nagy, P. Simon, L. Veisz. Advances in Physics: X, 6 (1), 1845795 (2021). DOI: 10.1080/23746149.2020.1845795
  4. O. Jahn, V.E. Leshchenko, P. Tzallas, A. Kessel, M. Kruger, A. Munzer, S.A. Trushin, G.D. Tsakiris, S. Kahaly, D. Kormin, L. Veisz, V. Pervak, F. Krausz, Z. Major, S. Karsch. Optica, 6, 280-287 (2019). DOI: 10.1364/OPTICA.6.000280
  5. A.A. Voronin, A. M. Zheltikov, T. Ditmire, B. Rus, G. Korn. Opt. Commun., 291, 299-303 (2013). DOI: 10.1016/j.optcom.2012.10.057
  6. G. Mourou, S. Mironov, E. Khazanov, A. Sergeev. The European Phys. J. Special Topics, 223 (6), 1181-1188 (2014). DOI: 10.1140/epjst/e2014-02171-5
  7. A.A. Voronin, A.M. Zheltikov. UFN, 186 (9), 957-966 (2016) (in Russian). DOI: 10.3367/UFNe.2016.02.037700
  8. S.Yu. Mironov, S. Fourmaux, P. Lassonde, V.N. Ginzburg, S. Payeur, J.-C. Kieffer, E.A. Khazanov, G. Mourou. Appl. Phys. Lett., 116, 241101 (2020). DOI: 10.1063/5.0008544
  9. J.I. Kim, Y.G. Kim, J.M. Yang, J.W. Yoon, J.H. Sung, S.K. Lee, C.H. Nam. Optics Express, 30 (6), 8734-8741 (2022). DOI: 10.1364/OE.452224
  10. M. Stanfield, N.F. Beier, S. Hakimi, H. Allison, D. Farinella, A. E. Hussein, T. Tajima, F. Dollar. Opt. Express, 29, 9123-9136 (2021). DOI: 10.1364/OE.417404
  11. T. Witting, F. Frank, C.A. Arrell, W.A. Okell, J.P. Marangos, J.W. Tisch. Opt. Lett., 36 (9), 1680-1682 (2011). DOI: 10.1364/OL.36.001680
  12. M.M. Nazarov, A.V. Mitrofanov, D.A. Sidorov-Biryukov, M.V. Chaschin, P.A. Shcheglov, A.M. Zheltikov, V.Y. Panchenko. J. Infrared, Millimeter, Terahertz Waves, 41 (9), 1069-1081 (2020). DOI: 10.1007/s10762-020-00689-z
  13. M.V. Kovalchuk, M.M. Borisov, A.A. Garmatina, V.M. Gordienko, A.M. Zheltikov, V.V. Kvardakov, V.N. Korchuganov, I.A. Likhachev, E.I. Mareev, A.V. Mitrofanov, M.M. Nazarov, E.M. Pashaev, F.V. Potemkin, Ya.O. Romanovskii, E.B. Rudneva, D.A. Sidorov-Biryukov, I.A. Subbotin, M.V. Chashchin, P.A. Shcheglov, V.Ya. Panchenko. Crystallography Rep., 67, 717-728 (2022). DOI: 10.1134/S106377452205008X
  14. FASTLITE [Electronic resource]. URL: https://fastlite.com/ produits/wizzler-ultrafast-pulse-measurement/
  15. T. Oksenhendler. arXiv:1204.4949 (2012). DOI: 10.48550/arXiv.1204.4949
  16. C. Iaconis, I.A. Walmsley. IEEE J. Guantum Electronics, 35 (4), 501-509 (1999). DOI: 10.1109/3.753654

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru