Hotspot Decorations Map Plasmonic Patterns with the Resolution of Scanning Probe Techniques

V. K. Valev, A. V. Silhanek, Y. Jeyaram, D. Denkova, B. De Clercq, V. Petkov, X. Zheng, V. Volskiy, W. Gillijns, G. A. E. Vandenbosch, O. A. Aktsipetrov, M. Ameloot, V. V. Moshchalkov, and T. Verbiest
Phys. Rev. Lett. 106, 226803 – Published 2 June 2011

Abstract

In high definition mapping of the plasmonic patterns on the surfaces of nanostructures, the diffraction limit of light remains an important obstacle. Here we demonstrate that this diffraction limit can be completely circumvented. We show that upon illuminating nanostructures made of nickel and palladium, the resulting surface-plasmon pattern is imprinted on the structures themselves; the hotspots (regions of local field enhancement) are decorated with overgrowths, allowing for their subsequent imaging with scanning-probe techniques. The resulting resolution of plasmon pattern imaging is correspondingly improved.

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  • Received 27 January 2011

DOI:https://doi.org/10.1103/PhysRevLett.106.226803

© 2011 American Physical Society

Authors & Affiliations

V. K. Valev1,*, A. V. Silhanek2, Y. Jeyaram2, D. Denkova2, B. De Clercq3, V. Petkov4, X. Zheng5, V. Volskiy5, W. Gillijns2, G. A. E. Vandenbosch5, O. A. Aktsipetrov6, M. Ameloot2, V. V. Moshchalkov2, and T. Verbiest1

  • 1Molecular Electronics and Photonics, INPAC, Katholieke Universiteit Leuven, Celestijnenlaan 200 D, B-3001 Leuven, Belgium
  • 2Nanoscale Superconductivity and Magnetism & Pulsed Fields Group, INPAC, Katholieke Universiteit Leuven, Celestijnenlaan 200 D, B-3001 Leuven, Belgium
  • 3University Hasselt and transnational University Limburg, BIOMED, Diepenbeek, Belgium
  • 4Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, Kasteelpark Arenberg 44, B-3001, Belgium
  • 5ESAT-TELEMIC, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
  • 6Department of Physics, Moscow State University, 11992 Moscow, Russia

  • *Corresponding author. v.k.valev@fys.kuleuven.be; http://www.valev.org

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Vol. 106, Iss. 22 — 3 June 2011

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