Characterization of the SPARC-EBIT at GSI

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Published 21 October 2010 Published under licence by IOP Publishing Ltd
, , Citation S Geyer et al 2010 JINST 5 C10003 DOI 10.1088/1748-0221/5/10/C10003

1748-0221/5/10/C10003

Abstract

An Electron Beam Ion Trap was installed at GSI Darmstadt, where it will be used for tests and offline measurements of components and experiments of SPARC (Stored Particle Atomic physics Research Collaboration) like HITRAP. The design of the so called SPARC-EBIT is based on a Helmholtz-pair of permanent magnets for electron beam compression. This results in a very compact room temperature source for highly charged ions (HCI), which is portable and simple to operate. To characterize the performance of the EBIT, X-ray and time-of-flight (TOF) spectra were recorded and also time-dependent current measurements were performed. For detection of X-rays from the interaction region a Silicon-pin diode was installed in front of the EBIT's beryllium window. The analysis of the in pulsed mode extracted ions was done with an achromatic TOF spectrometer, placed on the other end of a short test beam. With these investigation methods typical extraction pulses with argon ions were observed, from which the trap capacity and the effective trap length could be determined. The time-dependent charge state development of argon and krypton were studied depending on confinement time, axial trap depth and trap pressure with different measurement methods and the results were compared. In addition, simulations with CBSIM show the agreement between experimental achievements and theory and allow the determination of significant characteristics of the SPARC-EBIT.

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10.1088/1748-0221/5/10/C10003