日本結晶学会誌
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
解説
電子線トモグラフィーによる格子欠陥の三次元観察
波多 聰光原 昌寿中島 英治池田 賢一佐藤 和久村山 光宏工藤 博幸宮崎 伸介古河 弘光
著者情報
ジャーナル フリー

2015 年 57 巻 5 号 p. 276-284

詳細
抄録

Three-dimensionalization, i.e., direct representation or fabrication of three-dimensional (3D) objects, is now a key technology in various science and engineering fields. Electron microscopy, a vital nanoscale characterization tool, is no exception, thus various imaging methods have been developed to extend its imaging capabilities from conventional two dimensions to three dimensions. In this article, we focus on electron tomography (ET), which is a typical 3D imaging method using transmission electron microscopy (TEM) or scanning transmission electron microscopy(STEM), and overview the current status and future prospects of ET and an application of ET to 3D imaging of dislocations in crystalline materials as an practical example.

著者関連情報
© 2015 日本結晶学会
前の記事 次の記事
feedback
Top