An Alternative Method of Grain Boundary Characterization

Mariusz Jedrychowski; Jacek Tarasiuk; Brigitte Bacroix; Sebastian Wroński

doi:10.4028/www.scientific.net/MSF.753.93

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HomeMaterials Science ForumMaterials Science Forum Vol. 753An Alternative Method of Grain Boundary...

An Alternative Method of Grain Boundary Characterization

Abstract:

EBSD (Electron Backscatter Diffraction) is a modern experimental technique which allows to represent the information about texture and microstructure in the form of a topological map comprised of a very large number of acquisitioned orientation points. Such a map can be easily used to analyze grain boundaries. In TSL OIM Data Analysis software it is mainly done by Line Segments Method, in which grain boundaries are represented as lines separating pairs of EBSD points for which the misorientation value is within a specified range. The aim of this work is to present a complementary method of grain boundary characterization. In this case, a GB consists of specially selected EBSD points and is thus represented as a two dimensional area. As a result, new possibilities of GB analysis emerge, such as texture of GB areas. The provided description may be also more compatible with a real microstructure, especially after deformation, in which grain boundaries (especially the one with small misorientation) are indeed areas of lattice defects accumulation.

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Periodical:

Materials Science Forum (Volume 753)

Pages:

93-96

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.753.93

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Online since:

March 2013

Authors:

Mariusz Jedrychowski, Jacek Tarasiuk, Brigitte Bacroix, Sebastian Wroński

Keywords:

EBSD, Grain Boundary Analysis, HAGB, LAGB

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