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HomeJournal of Nano ResearchJournal of Nano Research Vol. 28Electron-Energy-Loss Spectra of Free-Standing...

Electron-Energy-Loss Spectra of Free-Standing Silicene

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Abstract:

Silicene is becoming one of the most important two-dimensional materials. In this work, EEL Spectra were calculated for α-silicene (flat), and β-silicene (low-buckled, and theoretically the most stable). Band structures were determined using the semi-empirical Tight-Binding Method considering second nearest neighbors, sp³ model, Harrison's rule, and Slater-Koster parameterization. The dielectric function was calculated within the Random Phase Approximation and a space discretization scheme. We found that, compared to bulk Si, additional resonances appear which are red-shifted. Buckling gives rise to a richer structure at low energy.

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Journal of Nano Research Vol. 28

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Periodical:

Journal of Nano Research (Volume 28)

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1-7

DOI:

https://doi.org/10.4028/www.scientific.net/JNanoR.28.1

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Online since:

June 2014

Authors:

Luis M. Priede*, Lilia Meza-Montes

Keywords:

Dielectric Function, EELS, Silicene, Tight Binding

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* - Corresponding Author

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