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Review of electronic speckle pattern interferometry (ESPI) for three dimensional displacement measurement

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Abstract

Three dimensional(3D) displacements, which can be translated further into 3D strain, are key parameters for design, manufacturing and quality control. Using different optical setups, phase-shift methods, and algorithms, several different 3D electronic speckle pattern interferometry(ESPI) systems for displacement and strain measurements have been achieved and commercialized. This paper provides a review of the recent developments in ESPI systems for 3D displacement and strain measurement. After an overview of the fundamentals of ESPI theory, temporal phase-shift, and spatial phase-shift techniques, 3D deformation measurements by the temporal phase-shift ESPI system, which is suited well for static measurement, and by the spatial phase-shift ESPI system, which is particularly useful for dynamic measurement, are discussed. For each method, the basic theory, a brief derivation and different optical layouts are presented. The state of art application, potential and limitation of the ESPI systems are shown and demonstrated.

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Author information

Authors and Affiliations

  1. Optical Laboratory, Department of Mechanical Engineering, Oakland University, Michigan, 48309, USA

    Lianxiang Yang & Xin Xie

  2. School of Instrument Science and Opto-Electronic Engineering, Beijing Information Science and Technology University, Beijing, 100192, China

    Lianxiang Yang, Lianqing Zhu & Sijin Wu

  3. School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, 230009, China

    Lianxiang Yang & Yonghong Wang

Authors
  1. Lianxiang Yang
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  2. Xin Xie
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Correspondence to Lianxiang Yang.

Additional information

The project is supported by National Natural Science Foundation of China (Grant Nos. 51275054, 51075116)

YANG Lianxiang received his PhD degree in mechanical engineering from the University of Kassel, Germany, in 1997. He is the director of optical laboratory and a professor in the department of mechanical engineering at Oakland University in USA. Prior to joining Oakland University in 2001, he was a R&D scientist at JDS-Uniphase, Canada, from 2000 to 2001, a senior engineer at Dantec-Ettemeyer AG(currently called Dantec-Dynamics GmbH), Germany, from 1998 to 2000, a research and senior research fellow at the University of Kassel, Germany, from 1991 to 1998, and a lecture at Hefei University of Technology, China, from 1986 to 1991. He has multi-disciplinary research experiences including optical metrology, experimental strain/stress analysis, nondestructive testing, and 3D computer vision. He is a fellow of SPIE, a Changjiang Scholar of Hefei University of Technology, China, and an adjunct professor of Beijing Information Science &Technology University, China.

XIE Xin is currently a PhD candidate at Optical Lab, Oakland University, United State of America. He received his bachelor of engineering in precise mechanical engineering from Hefei University of Technology in 2010 and master of science in mechanical engineering from Oakland University in 2012. His main research interests include optical metrology, phase-shift technology, digital shearography, non-destructive testing.

ZHU Lianqing is a professor of the School of Instruments Science & Optoelectronic Engineering, Beijing Information Science &Technology University, China. He has multi-disciplinary research experiences including optical metrology, biomedical detection technology and 3D computer vision. He is the director of Beijing Engineering Research Center of Photoelectric Information and Instruments, a council member of Chinese Society for Measurement, an executive member of the council and assistant secretary general at Mechanical Quantity Measurement Instrument Federation of China Instrument and Control Society.

WU Sijin received his PhD degree in optical engineering from Beijing Jiaotong University, China in 2012. Prior to receiving his PhD degree, he was an exchanged PhD candidate in the Optical Laboratory at Oakland University for two years. He joined Beijing Information Science & Technology University in July 2012 as a faculty member. His research interests include optical metrology, such as digital holography and digital shearography, experimental strain/stress analysis, nondestructive testing, 3D computer vision, etc.

WANG Yonghong received his PhD degree in precision mechanical engineering from Hefei University of Technology, China, in 2004. He was a postdoctoral fellow in the optical laboratory at Oakland University in Michigan from 2007 to 2008. He is currently a professor in the school of instrument science and opto-electronic engineering, Hefei University of Technology. He has authored and co-authored over 30 scientific research papers, owned 4 Chinese patents in the areas of optical techniques for whole-field and 3D measurement. His current research interests are precision metrology, advanced optical measuring techniques and image processing and their applications for the automotive, high-tech, and biomedical industries.

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Yang, L., Xie, X., Zhu, L. et al. Review of electronic speckle pattern interferometry (ESPI) for three dimensional displacement measurement. Chin. J. Mech. Eng. 27, 1–13 (2014). https://doi.org/10.3901/CJME.2014.01.001

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