Abstract
The surface morphology and microstructure of undoped and neodymium-doped silicate-phosphate films, as well as the strength characteristics (Young’s modulus and the hardness) of both the films and the SiO2-P2O5-Nd2O3/SLG and SiO2-P2O5/SLG composite structures, have been studied. A specific surface microstructure composed of the basic surface with imbedded round islands with a size of a few microns to a few tens of microns has been identified. The film’s microstructure has been shown to exhibit high stability over time after the long-term resting of these structures. It has been found that the films and the composite structures have fairly high strength properties.
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Original Russian Text © D.Z. Grabko, O.A. Shikimaka, M. Elisa, B.A. Sava, L. Boroica, E. Harea, C. Pirtac, A. Prisacaru, I. Feraru, D. Ursu, 2012, published in Elektronnaya Obrabotka Materialov, 2012, No. 5, pp. 63–73.
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Grabko, D.Z., Shikimaka, O.A., Elisa, M. et al. The surface morphology and strength properties of SiO2-P2O5-Nd2O3 glassy films. Surf. Engin. Appl.Electrochem. 48, 430–438 (2012). https://doi.org/10.3103/S1068375512050055
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DOI: https://doi.org/10.3103/S1068375512050055