Development of a Primary Ion Column for Mass Spectrometry-Based Surface Analysis

Authors

Raul A. VillacobFollow

Document Type

Thesis

Degree

Master of Science (MS)

Major/Program

Chemistry

First Advisor's Name

Francisco A. Fernandez-Lima

First Advisor's Committee Title

Committee Chair

Second Advisor's Name

Piero Gardinali

Second Advisor's Committee Title

Committee Member

Third Advisor's Name

Jeffrey Joens

Third Advisor's Committee Title

Committee Member

Keywords

Mass Spectrometry, Analytical Chemistry, Scientific Instrumentation Development, Focused Ion Beams, Surface Analysis, Mass Spectrometry Imaging, Nanoscale Imaging

Date of Defense

7-1-2016

Abstract

Secondary Ion Mass Spectrometry (SIMS) is a powerful technique for high spatial resolution chemical mapping and characterization of native surfaces. The use of massive cluster projectiles has been shown to extend the applicable mass range of SIMS and improve secondary ion yields 100 fold or beyond. These large projectiles however, present a challenge in terms of focusing due to the initial spatial and kinetic energy spreads inherent to their generation. In the present work, we describe the development and construction of a novel primary ion (PI) column employing a gold nanoparticle – liquid metal ion source (AuNP-LMIS) and the coupling to ultrahigh resolution mass spectrometers (e.g., Fourier Transform Ion Cyclotron Resonance Mass Spectrometer, FT-ICR MS) for accurate chemical characterization of complex biological surfaces. This work describes the ion dynamics, development and the experimental characterization of the AuNP-LMIS.

Identifier

FIDC000761

Recommended Citation

Villacob, Raul A., "Development of a Primary Ion Column for Mass Spectrometry-Based Surface Analysis" (2016). FIU Electronic Theses and Dissertations. 2561.
https://digitalcommons.fiu.edu/etd/2561