1993 年 22 巻 3 号 p. 113-122
Application of a profile fitting technique to the x-ray powder data obtained by a Gandolfi camera makes it possible for us to measure the precise lattice parameters of small crystals of several ten μm in size, with an error of about 20 ppm. In this paper, the procedure determinig the lattice parameters by a Gandolfi camera is outlined through a review of some principles and techniques underlying it.