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Title: Analytical Microscopy

Abstract

In the Analytical Microscopy group, within the National Center for Photovoltaic's Measurements and Characterization Division, we combine two complementary areas of analytical microscopy--electron microscopy and proximal-probe techniques--and use a variety of state-of-the-art imaging and analytical tools. We also design and build custom instrumentation and develop novel techniques that provide unique capabilities for studying materials and devices. In our work, we collaborate with you to solve materials- and device-related R&D problems. This sheet summarizes the uses and features of four major tools: transmission electron microscopy, scanning electron microscopy, the dual-beam focused-ion-beam workstation, and scanning probe microscopy.

Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
887349
Report Number(s):
NREL/BR-520-40120
TRN: US200618%%87
DOE Contract Number:  
AC36-99-GO10337
Resource Type:
Technical Report
Resource Relation:
Related Information: National Renewable Energy Laboratory (NREL) Measurements & Characterization (Brochure)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 47 OTHER INSTRUMENTATION; DESIGN; MICROSCOPY; PROBES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; MEASUREMENTS AND CHARACTERIZATION; NREL; NCPV; TECHNIQUES; CAPABILITIES; ANALYTICAL MICROSCOPY; Solar Energy - Photovoltaics

Citation Formats

. Analytical Microscopy. United States: N. p., 2006. Web. doi:10.2172/887349.
. Analytical Microscopy. United States. https://doi.org/10.2172/887349
. 2006. "Analytical Microscopy". United States. https://doi.org/10.2172/887349. https://www.osti.gov/servlets/purl/887349.
@article{osti_887349,
title = {Analytical Microscopy},
author = {},
abstractNote = {In the Analytical Microscopy group, within the National Center for Photovoltaic's Measurements and Characterization Division, we combine two complementary areas of analytical microscopy--electron microscopy and proximal-probe techniques--and use a variety of state-of-the-art imaging and analytical tools. We also design and build custom instrumentation and develop novel techniques that provide unique capabilities for studying materials and devices. In our work, we collaborate with you to solve materials- and device-related R&D problems. This sheet summarizes the uses and features of four major tools: transmission electron microscopy, scanning electron microscopy, the dual-beam focused-ion-beam workstation, and scanning probe microscopy.},
doi = {10.2172/887349},
url = {https://www.osti.gov/biblio/887349}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jun 01 00:00:00 EDT 2006},
month = {Thu Jun 01 00:00:00 EDT 2006}
}