In situ x-ray diffraction studies of a new LiMg{sub 0.125}Ni{sub 0.75}O{sub 2} cathode material
- Brookhaven National Lab., Upton, NY (US)
- FMC Corp., Princeton, NJ (US)
- Gould Electronics Inc., Eastlake, OH (US)
- Northeastern Univ., Boston, MA (US). Dept. of Chemistry
A Synchrotron x-ray source was used for In Situ x-ray diffraction studies during charge on a new LiMg{sub 0.125}Ti{sub 0.125}Ni{sub 0.75} cathode material synthesized by FMC Corp. It had been demonstrated by Gao that this new material has superior thermal stability than LiNiO{sub 2} and LiCo{sub 0.2}Ni{sub 0.8}O{sub 2} at over-charged state. In this current paper, studies on the relationship between the structural changes and thermal stability at over-charged state for these materials are presented. For the first time, the thermal stability of these materials are related to their structural changes during charge, especially to the formation and lattice constant change of a hexagonal phase (H3). The spectral evidence support the hypothesis that the improvement of thermal stability is obtained by suppressing the formation of H3 phase and reducing the shrinkage of its lattice constant c when charged above 4.3 V.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (US)
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 355000
- Report Number(s):
- BNL-66139; CONF-990514-; ON: DE99003360; TRN: US0301427
- Resource Relation:
- Other Information: Supercedes report DE99003360; PBD: [1999]; PBD: 1 Jul 1999
- Country of Publication:
- United States
- Language:
- English
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