Abstract
Correlation between the gas phase species in silane plasma measured by mass spectrometry and the properties of hydrogenated amorphous silicon (a-Si:H) films deposited by plasma enhanced chemical vapour deposition (PECVD) has been investigated. We have especially been interested in the higher-order silane related species in the plasma, whose contribution to the film growth is considered to be the cause of light-induced degradation in the film quality, especially at high growth rate. In this study, we varied excitation frequency, gas pressure and power density to vary the growth rates of a-Si:H films ranging from 2 Å/s to 20 Å/s.
Molecular density ratio of trisilane, representative of higher silane related radicals, to monosilane has shown a clear correspondence to the fill factor after light soaking of Schottky cells fabricated on the resulting films.
Similar content being viewed by others
References
A. Matsuda and K. Tanaka, Thin Solid Films 92, 171 (1982).
N. Nakamura, T. Takahama, M. Isomura, M. Nishikuni, K. Yoshida, S. Tsuda, S. Nakano, M. Ohnishi and Y. Kuwano, Jpn. J. Appl. Phys. 28, 1762 (1989).
G. Ganguly and A. Matsuda, Phys. Rev. B 47, 3661 (1992).
G. Lucovsky, R. J. Nemanich and J. C. Knights, Phys. Rev. B 19, 2064 (1978).
I. Hailer, Appl. Phys. Lett. 37, 282 (1980).
G. Turban, Y. Catherine and B. Grolleau, Thin Solid Films 67, 309 (1980).
C. M. Fortmann, S. Lange, M. Farley and J. O’Dowd, Proc. IEEE Photovoltaic Spec. Conf. 19th, 296 (1987).
Y. Watanabe, M. Shiratani, H. Kawasaki, S. Singh, T. Fukuzawa, Y. Ueda and H. Ohkura, J. Vac. Sci. Technol. A 14 (1996) 540.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Takagi, T., Hayashi, R., Payne, A. et al. High-Rate Growth of Stable a-Si:H. MRS Online Proceedings Library 557, 105–114 (1999). https://doi.org/10.1557/PROC-557-105
Published:
Issue Date:
DOI: https://doi.org/10.1557/PROC-557-105