Skip to main content
SpringerLink
Log in

Analysis of HgI2 and PbI2 Crystals and Detectors by Particle-Induced X-Ray Emission (PIXE) and Ion Backscattering Spectroscopy (IBS)

  • Published:
MRS Online Proceedings Library Aims and scope

Abstract

The Ion Micro-Analysis Group (IMAG) in Livermore conducts quantitative trace elemental analysis with PLXE and depth profiling with IBS using an MeV ion microbeam. The system has the capability to produce two-dimensional trace element and IBS images. PLXE analyses have been conducted on HgI2 and PbI2 crystals and detector materials in order to identify and quantify near surface trace contaminants. IBS measurements have been conducted to investigate elemental depth distributions in various materials. The results of measurements on several different samples are reported and a discussion of factors affecting quantitative in vacuo microanalysis of these materials is presented.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. S. A. E. Johansson and J. L. Campbell, PIXE A Novel Technique for Elemental Analysis, (John Wiley and Sons, Chichester, 1988).

    Google Scholar 

  2. J. R. Bird and J. S. Williams, Ion Beams for Materials Analysis, (Academic Press, Sydney, 1989).

    Google Scholar 

Download references

Acknowledgments

This work was supported by the U.S. Department of Energy under SNL Contract No. DE-AC04-76P00789 and LLNL Contract No. W-7405-ENG-48.

Author information

Authors and Affiliations

  1. Lawrence Livermore National Laboratory, Livermore, CA, 94550, USA

    G. S. Bench & D. W. Heikkinen

  2. Sandia National Laboratories, Livermore, CA, 94551, USA

    A. J. Antolak, D. H. Morse, A. E. Pontau, R. B. James & D. C. David

  3. Fisk University, Nashville, TN, 37208, USA

    A. Burger

  4. EG&G Energy Measurements, Goleta, CA, 93116, USA

    L. Van Den Berg

Authors
  1. G. S. Bench
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. J. Antolak
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. D. H. Morse
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. D. W. Heikkinen
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. A. E. Pontau
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. R. B. James
    View author publications

    You can also search for this author in PubMed Google Scholar

  7. D. C. David
    View author publications

    You can also search for this author in PubMed Google Scholar

  8. A. Burger
    View author publications

    You can also search for this author in PubMed Google Scholar

  9. L. Van Den Berg
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Bench, G.S., Antolak, A.J., Morse, D.H. et al. Analysis of HgI2 and PbI2 Crystals and Detectors by Particle-Induced X-Ray Emission (PIXE) and Ion Backscattering Spectroscopy (IBS). MRS Online Proceedings Library 302, 67–72 (1993). https://doi.org/10.1557/PROC-302-67

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/PROC-302-67

Search

Navigation