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Determination of size and distribution of second phases using nuclear microscopy

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Abstract

Nuclear microscopy combines a range of MeV light ion beam analytical techniques such as Proton Induced X-ray Emission (PIXE), Rutherford Backscattering Spectrometry (RBS), and Scanning Transmission Ion Microscopy (STIM). One of the main advantages of using MeV light ion beams for materials characterization is the large analytical volume due to their high penetration depth. This paper shows how nuclear microscopy is used to determine the size and distribution of Pb precipitates in a 40 μm thick alloy sample with a nominal composition of Al–5 wt.% Pb.

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Author notes

  1. L. T. Romano

    Present address: XEROX Palo Alto Research Center, 3333 Coyote Hill Road, 94304, Palo Alto, California, United Kingdom

Authors and Affiliations

  1. Nuclear Physics Laboratory, Keble Road, Oxford University, Oxford OX1 3RH, United Kingdom, USA

    M. B. H. Breese, G. W. Grime & F. Watt

  2. Materials Department, Parks Road, Oxford University, OX1 3RH, Oxford, United Kingdom

    L. T. Romano & C. J. Salter

Authors
  1. M. B. H. Breese
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  2. L. T. Romano
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  3. C. J. Salter
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  4. G. W. Grime
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  5. F. Watt
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Breese, M.B.H., Romano, L.T., Salter, C.J. et al. Determination of size and distribution of second phases using nuclear microscopy. Journal of Materials Research 7, 2373–2378 (1992). https://doi.org/10.1557/JMR.1992.2373

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  • DOI: https://doi.org/10.1557/JMR.1992.2373

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