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Microstructure and microwave properties of YBCO thin films grown on MgO and SrTiO3 by CVD

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Abstract

The microstructure and microwave properties of YBa2Cu3O7−δ thin films grown on SrTiO3 (100) and MgO (100) substrates by chemical vapor deposition have been studied. Both 100 GHz cavity measurement of surface resistance and ground plane substitution in a 5 GHz microstrip resonator show that films on SrTiO3 have better microwave properties than those on MgO. Although there are some a-axis grains and secondary phases on the surface, a large fraction of each film on SrTiO3 is epitaxial with its c axis normal to the substrate. The 100 GHz surface resistance of these films is less than copper for temperature ⋚ 82 K, and approaches the detection limit at 10–20 K. For the films on MgO, c-axis grains of different in-plane rotation are found together with some a-axis needle-like grains. The grain boundaries are detrimental to the microwave properties, and the resulting surface resistance at 100 GHz and 10–20 K is about 20 mΩ higher than that of films on SrTiO3.

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Authors and Affiliations

  1. Superconductor Technologies Inc., 460-F Ward Drive, Santa Barbara, California, 93111, USA

    K. H. Young, McD. Robinson, G. V. Negrete & G. Grüner

  2. Department of Electronics, Nagaoka University of Technology, Nagaoka, Niigata, 940-21, Japan

    T. Yamashita

  3. Institute for Materials Research, Tohoku University, Sendai, Miyagi, 980, Japan

    T. Hirai

  4. Technological Research Center, Riken Corporation, Kumagaya 810, Saitama, 360, Japan

    H. Suzuki & H. Kurosawa

  5. Department of Physics, University of California–Los Angeles, Los Angeles, California, 90024, USA

    L. Drabeck

Authors
  1. K. H. Young
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  2. McD. Robinson
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  3. G. V. Negrete
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  4. T. Yamashita
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  5. T. Hirai
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  6. H. Suzuki
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  7. H. Kurosawa
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  8. L. Drabeck
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  9. G. Grüner
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Young, K.H., Robinson, M., Negrete, G.V. et al. Microstructure and microwave properties of YBCO thin films grown on MgO and SrTiO3 by CVD. Journal of Materials Research 6, 2259–2263 (1991). https://doi.org/10.1557/JMR.1991.2259

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  • DOI: https://doi.org/10.1557/JMR.1991.2259

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