Abstract
The structure of Ti4Ni4Si7 is studied using powder neutron diffraction and Rietveld analysis. Prccise determination of the crystalline parameters, atomic positions, and temperature factors is achieved. A criterion previously elaborated for the phase TiFeSi2 is used to determine the coordination number. From the arrangement of the atoms in the unit cell and their interbond distances, we find that Si atoms are nearest neighbors to Ti and Ni. An extension of the same criterion shows that Ti–Ni and Ni–Si hybridization is likely to be strong while Ti–Ni hybridization is weak. A comparison with mono- and disilicides is made.
Similar content being viewed by others
References
S. P. Murarka, Silicides for VLSI Applications (Academic Press, New York, 1983).
F. M. d’Heurle, J. Tersoff, T. G. Finstad, and A. Cros, J. Appl. Phys. 59, 177 (1986).
J. H. Westbrook, R. K. DiCerbo, and A. J. Peat, GE Technical Report, #58-RL-2117 (1958).
V. Ya. Markiv, E. I. Gladyshevskii, P. I. Kripyakevich, and T. I. Fedoruk, Neorg. Mater. 2 (7), 1317 (1966).
V. Ya. Markiv, Acta Cryst. 21 (7), A84 (1966).
W. Jeitschko, A. G. Jordan, and P. A. Beck, Trans. TMS-AIME 245, 335 (1969).
V. Ya. Markiv, L. A. Lysenko, and E. I. Gladyshevskii, Neorg. Mater. 2 (11), 1980 (1966).
Yu. V. Voroshilov, V. Ya. Markiv, and E. I. Gladyshevskii, Neorg. Mater. 3 (8), 1404 (1967).
E. Horache, J. Van der Speigel, and J. E. Fischer, to be published in Thin Solid Films.
H. M. Rietvel, Acta Cryst. 22, 151 (1967); H. M. Rietveld, J. Appl. Cryst. 2, 65 (1969).
D. B. Wiles and R. A. Young, J. Appl. Cryst. 14, 149 (1981).
C. J. Howard and R. J. Hill, AAEC Report No. 000 (1985).
J. Newsam (personal communication).
L. Koster, Springer Tracts in Modern Physics, 36–39 (1977).
International Tables for X-ray Crystallography (The Kynoch Press, Birmingham, England, 1969), pp. 241–242.
J. Steinmetz, G. Venturini, B. Roques, N. Engel, B. Chabot, and E. Parthe, Acta Cryst. 18, 900 (1965).
C. B. Shoemaker and D. B. Shoemaker, Acta Cryst. 18, 900 (1965).
Pearson’s Handbook of Crystallographic Data for Intermetallic Phases, edited by P. Villars and L. P. Calvert (ASM, Metals Park, OH, 1985), Vol. 3.
M. J. Buerger, Contemporary Crystallography (McGraw-Hill Company, New York, 1970), p. 326.
E. Horache, J. E. Fischer, and M. W. Ruckman, in preparation.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Horache, E., Feist, T.P., Stuart, J.A. et al. Neutron Rietveld refinement of the structure of the ternary silicide Ti4Ni4Si7. Journal of Materials Research 5, 1887–1893 (1990). https://doi.org/10.1557/JMR.1990.1887
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/JMR.1990.1887