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Online erschienen: 2021-05-27
Erschienen im Druck: 2003-04-01
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FIB-Zielpräparation von TEM-Proben mittels Nadelmanipulationstechnik / FIB-Pinpointed Preparation of TEM Samples by a Needle Based Manipulator (Lift-Out) Technique
From the journal Practical Metallography
