Learning the core ideas of scanning probe microscopy by toy model inquiries

Abstract

Atomic force microscopy has developed from an atomic level imaging technique to a large family of nanoscientific research setups called scanning probe microscopy. Following this trend, we also need to develop our education from instructions to use the instrument for imaging into an approach of deeper understanding of the science behind the technologies. In this article, we describe our new university level scanning probe microscopy laboratory unit to learn the main scientific principles and applications of the instruments. Three inquiries using toy models were designed to cover the core ideas of scanning probe microscopy. Learning outcomes were analyzed and categorized into levels from the research reports of nine students. We found that practically every student learned atomic force imaging basics: scanning and essential properties of the topography image. One-third of the students showed good understanding in image artifacts and probe calibration, but just one of the students reached the level beyond the topography images to scanning force microscopy and combined force and topography techniques in his report. Also, the connection between scanning probe techniques and human senses was considered an important objective in design of this laboratory unit, although with modest success in learning so far.