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Single Beam Phase Microscopy: Conventional Solvers and Beyond

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Abstract

In this paper, conventional single beam phase retrieval techniques that are based on a series of defocused images are discussed in terms of their applicability in a single beam phase microscopy. Given the various advantages of the individual solvers, an hybrid approach based on a combined TIE wave propagation based solver is proposed to overcome the difficulties and extend the applications of the conventional solvers.

© 2014 Optical Society of America

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