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In situ high temperature single crystal X-ray diffraction study of a natural omphacite

Published online by Cambridge University Press:  05 July 2018

A. Pavese ,
R. Bocchio  and
G. Ivaldi
A. Pavese*
Affiliation:
Dipartimento Scienze della Terra-Università degli Studi di Milano, Via Botticelli 23, 20133 Milano, Italy National Research Council, Centro di Studio per la geodinamica alpina e quaternaria, Via Botticelli 23, 20133 Milano, Italy
R. Bocchio
Affiliation:
Dipartimento Scienze della Terra-Università degli Studi di Milano, Via Botticelli 23, 20133 Milano, Italy
G. Ivaldi
Affiliation:
Dipartimento Scienze Mineralogiche e Petrologiche-Università degli Studi di Torino, Via Valperga Caluso 35, 10125 Torino, Italy
*
*E-mail: pavese@p8000.terra.unimi.it
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Abstract

In situ high temperature single crystal X-ray diffraction (XRD) experiments have been performed on a chemically quasi-ideal omphacite sample up to 1000°C. The lattice parameters were studied as a function of temperature, and their thermal expansion coefficients determined. The b and c cell edges show discontinuities as a function of temperature which are interpreted here in terms of intracrystalline cation diffusion processes. Structure refinements have been carried out using data collected at room temperature, at 800°C and at ambient conditions after cooling. The structural behaviour as a function of temperature of chemically quasi-ideal omphacites is compared with those of jadeite and diopside.

Keywords

omphaciteshigh temperaturethermal expansion
Type
Research Article
Information
Mineralogical Magazine , Volume 64 , Issue 6 , December 2000 , pp. 983 - 993
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 2000

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