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A New Method for Fourier Analysis of Shapes of X-Ray Peaks and its Application to Line Broadening and Integrated Intensity Measurements

Published online by Cambridge University Press:  06 March 2019

R. L. Rothman  and
J. B. Cohen
R. L. Rothman
Affiliation:
Department of Materials Science, Northwestern University, Evanston, Illinois
J. B. Cohen
Affiliation:
Department of Materials Science, Northwestern University, Evanston, Illinois
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Abstract

A method of Fourier analysis of x-ray line broadening is presented whereby microstrain, incoherent particle size, and fault probability can be calculated using only first-order peaks. This method can thus be used in studies of catalysts, vapor- and electrodeposits or heavily textured specimens for which second-order peaks are too broad or weak, in cases where the effect of particle size is not the same for all orders of a peak, or for multiphase specimens where overlap of peaks sometimes occurs. Examples of deformed FCG and BCC metals and alloys are presented, with comparisons to the method of multiple orders.

One part of the procedure, first demonstrated by Pines and Sirenko, provides for reducing the effects of truncation on the Fourier coefficients. As a result, larger particle sizes can be analyzed and the integrated intensity can be determined more precisely. Application to determinations of volume fraction are given.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 12: Seventeenth Annual Conference on Applications of X-ray Analysis, August 21-23, 1968 , 1968 , pp. 208 - 235
Copyright
Copyright © International Centre for Diffraction Data 1968

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