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Instrumental aspects in X-ray diffraction on polycrystalline materials

Published online by Cambridge University Press:  01 March 2012

R. Guinebretière ,
A. Boulle ,
O. Masson  and
A. Dauger
R. Guinebretière*
Affiliation:
Science des Procédés Céramiques et de Traitements de Surface, CNRS, UMR 6638, ENSCI, 47 Av. A. Thomas 87065 Limoges, France
A. Boulle
Affiliation:
Science des Procédés Céramiques et de Traitements de Surface, CNRS, UMR 6638, ENSCI, 47 Av. A. Thomas 87065 Limoges, France
O. Masson
Affiliation:
Science des Procédés Céramiques et de Traitements de Surface, CNRS, UMR 6638, ENSCI, 47 Av. A. Thomas 87065 Limoges, France
A. Dauger
Affiliation:
Science des Procédés Céramiques et de Traitements de Surface, CNRS, UMR 6638, ENSCI, 47 Av. A. Thomas 87065 Limoges, France
*
a)Electronic mail: r_guinebretiere@ensci.fr
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Abstract

The purpose of this paper is to give a rapid overview of the recent developments in the field of X-ray diffraction on polycrystalline materials from the viewpoint of the instruments. After a brief historical report, the main types of laboratory diffractometers are presented. At the end of the twentieth century the apparition of position sensitive detectors and artificial crystal monochromators have induced the conception of new diffractometer often based on old geometrical arrangements. Those modern diffractometers are described with respect to the more conventional ones. Among the experimental parameters which can characterize a given diffractometer, the instrumental resolution function and the acquisition time of the pattern are of primary importance. The different apparatus are compared with respect to those two parameters.

Keywords

X-ray diffractioninstrumentationlaboratory diffractometers
Type
Invited Articles
Information
Powder Diffraction , Volume 20 , Issue 4 , December 2005 , pp. 294 - 305
Copyright
Copyright © Cambridge University Press 2005

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