Electro‐Optical Characterization of Sulfur‐Annealed Chemical‐Bath Deposited CdS Films

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© 1994 ECS - The Electrochemical Society
, , Citation L. Hernández et al 1994 J. Electrochem. Soc. 141 3238 DOI 10.1149/1.2059310

1945-7111/141/11/3238

Abstract

We report some optical and electrical properties of thin films fabricated by chemical‐bath deposition. We investigated transmission, infrared, ultraviolet, and photoluminescence spectra, and did scanning electron microscopy, x‐ray diffraction, and resistivity measurements before and after thermal annealing in a atmosphere at different temperatures. A minimum bandgap and resistivity together with good definition in ultraviolet and infrared spectra at annealing temperature of 250°C support the existence of a predominant cubic phase for that annealing condition.

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10.1149/1.2059310