ABSTRACT
Early design decisions concerning logic packages often make subsequent testing difficult. To minimize such problems, logic designers must maintain close communication with those responsible for testing the finished product. This paper explores a user-oriented system which enables the designer to recognize and correct testing problems in the early stages of design.
- 1.G. R. Putzolu and J. P. Roth, "An Algorithm and a Program for Generation of Test Patterns for Sequential Circuits," Proceedings of the Third Hawaii International Conference on System Sciences, (Honolulu). Western Periodical Company, January, 1970, pp. 64-67.Google Scholar
- 2.E. B. Eichelberger, "Hazard Detection in Combinational and Sequential Switching Circuits," IBM Journal of Research and Development, pp. 90-99, March, 1965.Google Scholar
Index Terms
- Minimizing the problem of logic testing by the interaction of a design group with user-oriented facilities
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