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Enhancing SSD reliability through efficient RAID support

Published:23 July 2012Publication History

ABSTRACT

A serious problem with current SSDs is its low reliability due to their primary component, flash-memory, that has high error rate and limited erase count. Adopting RAID architecture is a reasonable way to increase reliability of SSDs. In this paper, we propose Dynamic and Variable Size Striping-RAID (DVS-RAID) that dynamically constructs a variable size stripe based on arrival order of write requests such that write requests are sequentially written to a stripe improving the performance and lifetime of SSDs. To increase the reliability of small writes without making use of non-volatile RAM, DVS-RAID employs variable size striping, which constructs a new stripe with data written to portions of a full stripe and writes a parity for that partial stripe. We implement DVS-RAID in the DiskSim SSD extension, and experimental results based on trace-driven simulations show that DVS-RAID outperforms the conventional RAID-5 scheme in terms of performance and lifetime of SSDs.

References

  1. UMASS TRACE REPOSITORY. http://traces.cs.umass.edit.Google ScholarGoogle Scholar
  2. N. Agrawal, V. Prabhakaran, T. Wobber, J. D. Davis, M. Manasse, and R. Panigrahy. Design tradeoffs for SSD performance. In 2008 USENIX ATC. Google ScholarGoogle ScholarDigital LibraryDigital Library
  3. E. Deal. Trends in NAND flash memory error correction. Cyclic Design, White Paper, Jun. 2009, http://www.cyclicdesign.com/whitepapers/Cyclic_Design_NAND_ECC.pdf.Google ScholarGoogle Scholar
  4. L. M. Grupp, A. M. Caulfield, J. Coburn, S. Swanson, E. Yaakobi, P. H. Siegel, and J. K. Wolf. Characterizing flash memory: anomalies, observations, and applications. In Proceedings of MICRO 42. Google ScholarGoogle ScholarDigital LibraryDigital Library
  5. S. Im and D. Shin. Flash-Aware RAID Techniques for Dependable and High-Performance Flash Memory SSD. IEEE Transactions on Computers, 60(1): 80--92, Jan. 2011. Google ScholarGoogle ScholarDigital LibraryDigital Library
  6. M. G. Laura. D. D. John, and S. Steven. The Bleak Future of NAND Flash Memory. In Proceedings of FAST '12, 2012. Google ScholarGoogle ScholarDigital LibraryDigital Library
  7. S. Lee, B. Lee, K. Koh, and H. Bahn. A lifespan-aware reliability scheme for RAID-based flash storage. In Proceedings of the 2011 ACM SAC. Google ScholarGoogle ScholarDigital LibraryDigital Library
  8. Y. Lee, S. Jung, and Y. H. Song. FRA: a flash-aware redundancy array of flash storage devices. In Proceedings of CODES+ISSS '09, 2009. Google ScholarGoogle ScholarDigital LibraryDigital Library
  9. M. Mariano. Ecc options for improving nand flash memory reliability. Micron, 2012, http://www.micron.com/support/software/~/media/Documents/Products/Software%20Article/SWNL_implementing_ecc.ashx.Google ScholarGoogle Scholar
  10. V. Prabhakaran and T. Wobber. SSD Extension for DiskSim Simulation Environment. http://research.microsoft.com/en-us/downloads/b41019e2-1d2b-44d8-b512-ba35ab814cd4.Google ScholarGoogle Scholar

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  • Published in

    cover image ACM Other conferences
    APSYS '12: Proceedings of the Asia-Pacific Workshop on Systems
    July 2012
    101 pages
    ISBN:9781450316699
    DOI:10.1145/2349896

    Copyright © 2012 ACM

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    Association for Computing Machinery

    New York, NY, United States

    Publication History

    • Published: 23 July 2012

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    Overall Acceptance Rate149of386submissions,39%

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