Improvement of InGaZnO4 Thin Film Transistors Characteristics Utilizing Excimer Laser Annealing

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Published 6 February 2009 ©2009 The Japan Society of Applied Physics
, , Citation Mitsuru Nakata et al 2009 Appl. Phys. Express 2 021102 DOI 10.1143/APEX.2.021102

1882-0786/2/2/021102

Abstract

This paper describes a method for utilizing an excimer laser to improve the characteristics of InGaZnO4 (IGZO) thin-film transistors (TFTs). IGZO-TFTs fabricated at room temperature are irradiated with an excimer laser to raise the temperature of the IGZO films for only a very short time, some tens of ns. The ON current of an irradiated IGZO-TFT is more than one order of magnitude higher than that of an un-irradiated TFT. This method is promising for achieving high performance IGZO-TFTs on plastic substrates because the thermal damage to substrates will be much less than that which would result from furnace annealing.

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10.1143/APEX.2.021102