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Minitips in Frequency-Modulation Atomic Force Microscopy at Liquid–Solid Interfaces

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Published 7 February 2012 Copyright (c) 2012 The Japan Society of Applied Physics
, , Citation Takumi Hiasa et al 2012 Jpn. J. Appl. Phys. 51 025703 DOI 10.1143/JJAP.51.025703

1347-4065/51/2R/025703

Abstract

A frequency-modulation atomic force microscope was operated in liquid using sharpened and cone-shaped tips. The topography of mica and alkanethiol monolayers was obtained with subnanometer resolution, regardless of nominal tip radius, which was either 10 or 250 nm. Force–distance curves determined over a hexadecane–thiol interface showed force modulations caused by liquid layers structured at the interface. The amplitude of force modulation and the layer-to-layer distance were completely insensitive to the nominal tip radius. These results are evidence that minitips smaller than the nominal radius are present on the tip body and function as a force probe.

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10.1143/JJAP.51.025703