Time-Resolved X-Ray Absorption Spectroscopy for Laser-Ablated Silicon Particles in Xenon Gas

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Copyright (c) 1996 The Japan Society of Applied Physics
, , Citation Tetsuya Makimura Tetsuya Makimura et al 1996 Jpn. J. Appl. Phys. 35 L735 DOI 10.1143/JJAP.35.L735

1347-4065/35/6A/L735

Abstract

We developed a laboratory-scale in situ apparatus for soft X-ray absorption spectroscopy with a time resolution of 10 ns and a space resolution of 100  µm. Utilizing this spectrometer, we have investigated the dynamics of silicon atoms formed by laser ablation in xenon gas. It was found that 4d-electrons in the xenon atoms are excited through collision with electrons in the laser-generated silicon plasma.

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10.1143/JJAP.35.L735