Production of High-Quality Thin-Film Samples of Al-Cu-Fe Icosahedral Quasicrystal

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Copyright (c) 1995 The Japan Society of Applied Physics
, , Citation Akinori Yoshioka Akinori Yoshioka et al 1995 Jpn. J. Appl. Phys. 34 1606 DOI 10.1143/JJAP.34.1606

1347-4065/34/3R/1606

Abstract

Thin-film samples of Al-Cu-Fe icosahedral quasicrystal have been successfully produced by vacuum deposition with an electron beam evaporation apparatus followed by annealing. Coating the film surfaces with alumina has been found to be essential in avoiding compositional change during annealing. X-ray diffractometry and electrical resistivity measurements have shown that the annealed sample having the icosahedral phase is of high quality.

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10.1143/JJAP.34.1606