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Determination of trace impurities in tantalum powder and its compounds by inductively coupled plasma optical emission spectrometry using solvent extraction

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Abstract

A procedure was developed for the analysis of 18 trace impurity elements in capacitor-grade tantalum powder (Ta), potassium tantalum fluoride (K2TaF7), and tantalum pentoxide (Ta2O5) using inductively coupled plasma optical emission spectrometry (ICP-OES). The detection limits achieved were in the ppb levels. The samples were dissolved in hydrofluoric acid (HF) in a microwave digestion system and the Ta matrix was extracted using cyclo hexanone. The impurity traces remained almost completely in the aqueous phase.

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Authors and Affiliations

  1. Characterization Division, Center for Materials for Electronics Technolog (C-MET) IDA, Phase II, HCL Post, Cherlapally, Hyderabad, 500051, India

    G. Anil, M. R. P. Reddy & T. L. Prakash

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  1. G. Anil
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  2. M. R. P. Reddy
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  3. T. L. Prakash
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The text was submitted by the authors in English.

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Anil, G., Reddy, M.R.P. & Prakash, T.L. Determination of trace impurities in tantalum powder and its compounds by inductively coupled plasma optical emission spectrometry using solvent extraction. J Anal Chem 61, 641–643 (2006). https://doi.org/10.1134/S1061934806070069

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  • DOI: https://doi.org/10.1134/S1061934806070069

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