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Atomic force microscopy modified for studying electric properties of thin films and crystals. Review

  • Surface. Thin Films
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Abstract

Probe force microscopy continues growing in popularity as a method for studying surfaces of solids and control over crystals and thin films that are grown on various scientific and industrial setups. New modifications of the method increase the possibilities for recording various characteristics of the objects studied. An important role here is played by “electrical” force microscopy, the various modifications and practical applications of which are considered below, as well as the results obtained by this method.

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Authors and Affiliations

  1. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, Russia

    K. L. Sorokina & A. L. Tolstikhina

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  1. K. L. Sorokina
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  2. A. L. Tolstikhina
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__________

Translated from Kristallografiya, Vol. 49, No. 3, 2004, pp. 541–565.

Original Russian Text Copyright © 2004 by Sorokina, Tolstikhina.

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Sorokina, K.L., Tolstikhina, A.L. Atomic force microscopy modified for studying electric properties of thin films and crystals. Review. Crystallogr. Rep. 49, 476–499 (2004). https://doi.org/10.1134/1.1756648

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