Presentation + Paper
20 June 2021 Modelling of the photometric balance for two-wavelength spatially multiplexed digital holography
Author Affiliations +
Abstract
Multi-wavelength digital holography is a very powerful approach for surface shape measurements. It has the advantage of being contact-less, non-intrusive, and yields full-field surface shape data without any requirement for scanning. When dealing with off-axis digital holography and spatial multiplexing of two-wavelength digital holograms, the method becomes real-time, in the sense that the surface shape can be measured at each time instant at which the holograms are recorded. Thus, phase shifting and sequential recording are suppressed. However, due to the roughness of the inspected surface, speckle decorrelation occurs and noise is included in the final data. The noise amount in the data must be investigated in order to define the best processing approach for holograms. This paper proposes the analysis of the standard deviation of noise in surface-shape data from two-wavelength spatially-multiplexed digital holograms. The influence of noise on the measurements of the surface shape is described by an analytical approach. Relationships to quantify the minimum measurable surface height is given by taking into account the experimental parameters of the set-up. These parameters are related to the spatial bandwidths, modulation of holograms, saturation ratio, number of electrons in pixels, readout noise, quantization noise, photon noise, and speckle decorrelation due to roughness. The theoretical modeling is discussed and analysis when considering practical situation for industrial surface shape measurements.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Matthieu Piniard, Béatrice Sorrente, Gilles Hug, and Pascal Picart "Modelling of the photometric balance for two-wavelength spatially multiplexed digital holography", Proc. SPIE 11783, Modeling Aspects in Optical Metrology VIII, 1178308 (20 June 2021); https://doi.org/10.1117/12.2593719
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Digital holography

Holograms

Multiplexing

Modeling

Shape analysis

Speckle

Modulation

Back to Top