Shekhar Borkar
ABSTRACT
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.
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Cross Ref
- Borkar, S., "Parameter Variations and Impact on Circuits & Microarchitecture", C2S2 MARCO review, March 2003. Google ScholarDigital Library
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Index Terms
- Parameter variations and impact on circuits and microarchitecture
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