(Ta/Si) multilayer as a wide-bandpass monochromator material

Specular and non-specular X-ray reflectivity intensities of a (Ta/Si)₆₀ multilayer sample were measured to characterize its interface structure. Since the multilayer has a good reflectance at its multilayer peaks, its performance as a wide-bandpass monochromator for X-ray scattering experiments of polymers has been tested.