Abstract
A first-principles study of the complex in B-doped Czochralski Si reveals a defect-bistability-mediated carrier recombination mechanism, which contrasts with the standard fixed-level Shockley-Read-Hall model of recombination. An dimer distant from B causes only weak carrier recombination, which nevertheless drives diffusion under light to form the complex. Although and produce nearly identical defect levels in the band gap, the recombination at is substantially faster than at because the charge state of the latter inhibits the hole capture step of recombination.
- Received 18 July 2005
DOI:https://doi.org/10.1103/PhysRevLett.97.256602
©2006 American Physical Society