Reversible Structural Transition in Epitaxial Manganite Film

Q. Zhan, R. Yu, L. L. He, D. X. Li, J. Li, S. Y. Xu, and C. K. Ong
Phys. Rev. Lett. 88, 196104 – Published 29 April 2002
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Abstract

A reversible structural transition of an epitaxial La2/3Sr1/3MnO3 film deposited on a LaAlO3 substrate has been investigated by means of in situ high-resolution transmission electron microscopy and electron diffraction, combined with image and diffraction calculations. We observe that the crystallographic symmetry of the film can be lowered via electron beam irradiation, leading to a rhombohedral-monoclinic transition. This transition can be attributed to the cooperating effect of the mismatch stress and the irradiation-induced thermal stress.

  • Received 11 December 2001

DOI:https://doi.org/10.1103/PhysRevLett.88.196104

©2002 American Physical Society

Authors & Affiliations

Q. Zhan1, R. Yu1,*, L. L. He1, D. X. Li1, J. Li2, S. Y. Xu2, and C. K. Ong2

  • 1Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, China
  • 2Department of Physics, National University of Singapore, Singapore 119260

  • *Corresponding author. Email address: ryu@imr.ac.cn

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Vol. 88, Iss. 19 — 13 May 2002

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