Photoluminescence of Isotopically Purified Silicon: How Sharp are Bound Exciton Transitions?

D. Karaiskaj, M. L. W. Thewalt, T. Ruf, M. Cardona, H.-J. Pohl, G. G. Deviatych, P. G. Sennikov, and H. Riemann
Phys. Rev. Lett. 86, 6010 – Published 25 June 2001
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Abstract

We report the first high resolution photoluminescence studies of isotopically pure Si ( 99.896%28Si). New information is obtained on isotopic effects on the indirect band gap energy, phonon energies, and phonon broadenings, which is in good agreement with calculations and previous results obtained in Ge and diamond. Remarkably, the linewidths of the no-phonon boron and phosphorus bound exciton transitions in the 28Si sample are much narrower than in natural Si and are not well resolved at our maximum instrumental resolution of 0.014cm1. The removal of the dominant broadening resulting from isotopic randomness in natural Si reveals new fine structure in the boron bound exciton luminescence.

  • Received 1 March 2001

DOI:https://doi.org/10.1103/PhysRevLett.86.6010

©2001 American Physical Society

Authors & Affiliations

D. Karaiskaj and M. L. W. Thewalt

  • Department of Physics, Simon Fraser University, Burnaby, British Columbia, Canada V5A 1S6

T. Ruf and M. Cardona

  • Max-Planck-Institut für Festkörperforschung, 70569 Stuttgart, Germany

H.-J. Pohl

  • VITCON Projectconsult GmbH, 07745 Jena, Germany

G. G. Deviatych and P. G. Sennikov

  • Institute of Chemistry of Highly Pure Substances, RAS, 603600 Nizhny Novgorod, Russia

H. Riemann

  • Institut für Kristallzucht, Berlin, Germany

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Vol. 86, Iss. 26 — 25 June 2001

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