High resolution electron microscope images of the $\mathrm{Si}\left(111\right)-(7\times 7)$ surface in the plan-view geometry have been analyzed, and the overlap of the top and bottom surfaces has been extracted numerically. The resultant images show clearly not just the adatoms seen by scanning tunneling microscopy but all the atoms in the top three layers, including the dimers in the third layer.

• Received 8 July 1996

DOI:https://doi.org/10.1103/PhysRevLett.77.4226