Observation of high electron emission yields following highly charged ion impact (up to Th75+) on surfaces

J. W. McDonald, D. Schneider, M. W. Clark, and D. Dewitt
Phys. Rev. Lett. 68, 2297 – Published 13 April 1992
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Abstract

Double differential electron emission yields following the impact of fast (3.95×107cm/sec)Ar9,12,18+, Ne9+, Xe30,44+, and Th70,75+ ions on Cu and Au targets have been measured. The electron emission is dominated by low-energy electrons (<50 eV). It is found that the total yield, which rises to about 100 electrons per ion, is a nonlinear function of the total potential energy of the incident ion (up to about 200 keV).

  • Received 25 November 1991

DOI:https://doi.org/10.1103/PhysRevLett.68.2297

©1992 American Physical Society

Authors & Affiliations

J. W. McDonald, D. Schneider, M. W. Clark, and D. Dewitt

  • Lawrence Livermore National Laboratory, University of California, Livermore, California 94550

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Issue

Vol. 68, Iss. 15 — 13 April 1992

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