Critical sheet resistance for the suppression of superconductivity in thin Mo-C films

S. J. Lee and J. B. Ketterson
Phys. Rev. Lett. 64, 3078 – Published 18 June 1990
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Abstract

We report resistivity and superconducting transition temperature measurements on ultrathin MoC films (down to 4.0 Å). We find that the critical sheet resistance separating the superconducting and insulating states at T=0 lies in the range 2.8–3.5 kΩ, which is about one-half of that reported for Bi films.

  • Received 30 January 1990

DOI:https://doi.org/10.1103/PhysRevLett.64.3078

©1990 American Physical Society

Authors & Affiliations

S. J. Lee and J. B. Ketterson

  • Department of Physics and Astronomy
  • Materials Research Center, Northwestern University, Evanston, Illinois 60208

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Issue

Vol. 64, Iss. 25 — 18 June 1990

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