Abstract
We have studied two-dimensional and three-dimensional Co epitaxial layers on Si(111) by polarization-dependent surface extended x-ray-absorption fine structure on the Co edge (7707 eV). The Co interface atoms are coordinated with eight Si atoms, as in bulk Co, with an interface bond length of 2.35(0.03) Å. Ultrathin three-dimensional Co layers are 2.5% contracted in the direction perpendicular to the interface.
- Received 22 June 1988
DOI:https://doi.org/10.1103/PhysRevLett.62.191
©1989 American Physical Society