Abstract
New results for the magnitude of flicker noise, considered as resistance fluctuations, in random resistor networks are reported. Near the percolation threshold , the magnitude of the relative noise is shown to diverge as . The new exponent is calculated by various methods: Monte Carlo simulations, effective-medium theory, and position-space renormalization group. Exponents pertaining to higher-order cumulants of the resistance fluctuations are also calculated. The possible implications of our results for ongoing experiments on metal-insulator mixtures and cermets are also discussed.
- Received 10 December 1984
DOI:https://doi.org/10.1103/PhysRevLett.54.1718
©1985 American Physical Society