High Contrast X-ray Speckle from Atomic-Scale Order in Liquids and Glasses

S. O. Hruszkewycz, M. Sutton, P. H. Fuoss, B. Adams, S. Rosenkranz, K. F. Ludwig, Jr., W. Roseker, D. Fritz, M. Cammarata, D. Zhu, S. Lee, H. Lemke, C. Gutt, A. Robert, G. Grübel, and G. B. Stephenson
Phys. Rev. Lett. 109, 185502 – Published 2 November 2012
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Abstract

The availability of ultrafast pulses of coherent hard x rays from the Linac Coherent Light Source opens new opportunities for studies of atomic-scale dynamics in amorphous materials. Here, we show that single ultrafast coherent x-ray pulses can be used to observe the speckle contrast in the high-angle diffraction from liquid Ga and glassy Ni2Pd2P and B2O3. We determine the thresholds above which the x-ray pulses disturb the atomic arrangements. Furthermore, high contrast speckle is observed in scattering patterns from the glasses integrated over many pulses, demonstrating that the source and optics are sufficiently stable for x-ray photon correlation spectroscopy studies of dynamics over a wide range of time scales.

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  • Received 14 February 2012

DOI:https://doi.org/10.1103/PhysRevLett.109.185502

© 2012 American Physical Society

Authors & Affiliations

S. O. Hruszkewycz1, M. Sutton2, P. H. Fuoss1, B. Adams3, S. Rosenkranz1, K. F. Ludwig, Jr.4, W. Roseker5, D. Fritz6, M. Cammarata6, D. Zhu6, S. Lee5,6,*, H. Lemke6, C. Gutt5, A. Robert6, G. Grübel5, and G. B. Stephenson1,7

  • 1Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
  • 2Department of Physics, McGill University, Montreal, Québec H3A2T8, Canada
  • 3X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
  • 4Department of Physics, Boston University, Boston, Massachusetts 02215, USA
  • 5HASYLAB, Deutsches Elektronen-Synchrotron, Notkestraβe 85, D-22607 Hamburg, Germany
  • 6Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
  • 7Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

  • *Present address: Physical Metrology Division, Korea Research Institute of Standards and Science, Daejeon 305-340, Republic of Korea.

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Issue

Vol. 109, Iss. 18 — 2 November 2012

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