Quantum Metrology with Entangled Coherent States

Jaewoo Joo, William J. Munro, and Timothy P. Spiller
Phys. Rev. Lett. 107, 083601 – Published 16 August 2011; Erratum Phys. Rev. Lett. 107, 219902 (2011)

Abstract

We present an improved phase estimation scheme employing entangled coherent states and demonstrate that these states give the smallest variance in the phase parameter in comparison to NOON, “bat,” and “optimal” states under perfect and lossy conditions. As these advantages emerge for very modest particle numbers, the optical version of entangled coherent state metrology is achievable with current technology.

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  • Received 28 January 2011

DOI:https://doi.org/10.1103/PhysRevLett.107.083601

© 2011 American Physical Society

Erratum

Erratum: Quantum Metrology with Entangled Coherent States [Phys. Rev. Lett. 107, 083601 (2011)]

Jaewoo Joo, William J. Munro, and Timothy P. Spiller
Phys. Rev. Lett. 107, 219902 (2011)

Authors & Affiliations

Jaewoo Joo1, William J. Munro2,1, and Timothy P. Spiller1

  • 1Quantum Information Science, School of Physics and Astronomy, University of Leeds, Leeds LS2 9JT, United Kingdom
  • 2NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi-shi, Kanagawa 243-0198, Japan

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Issue

Vol. 107, Iss. 8 — 19 August 2011

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