Abstract
- Received 11 March 2009
DOI:https://doi.org/10.1103/PhysRevLett.102.119901
©2009 American Physical Society
Publisher’s Note: Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit [Phys. Rev. Lett. 102, 090502 (2009)]
J. M. Chow, J. M. Gambetta, L. Tornberg, Jens Koch, Lev S. Bishop, A. A. Houck, B. R. Johnson, L. Frunzio, S. M. Girvin, and R. J. Schoelkopf
Phys. Rev. Lett. 102, 119901 – Published 18 March 2009
