Abstract
We studied the surface structure of thin films using in situ scanning tunneling microscopy (STM). Atomically resolved STM images reveal that a reconstructed surface and a () surface can be converted back and forth through adsorption and desorption of oxygen at the surface. The electrical properties of the surfaces are investigated by scanning tunneling spectroscopy. curves clearly show that the presence of an oxygen overlayer renders the surface insulating while the () surface without the oxygen overlayer is metallic.
- Received 10 November 2008
DOI:https://doi.org/10.1103/PhysRevLett.102.066104
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