Nonlinear Screening and Ballistic Transport in a Graphene pn Junction

L. M. Zhang and M. M. Fogler
Phys. Rev. Lett. 100, 116804 – Published 21 March 2008

Abstract

We study the charge density distribution, the electric field profile, and the resistance of an electrostatically created lateral pn junction in graphene. We show that the electric field at the interface of the electron and hole regions is strongly enhanced due to limited screening capacity of Dirac quasiparticles. Accordingly, the junction resistance is lower than estimated in previous literature.

  • Figure
  • Figure
  • Received 11 August 2007

DOI:https://doi.org/10.1103/PhysRevLett.100.116804

©2008 American Physical Society

Authors & Affiliations

L. M. Zhang and M. M. Fogler

  • Department of Physics, University of California, San Diego, 9500 Gilman Drive, La Jolla, California 92093, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 100, Iss. 11 — 21 March 2008

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×