Relativistic electromagnetic ion cyclotron instabilities

K. R. Chen, R. D. Huang, J. C. Wang, and Y. Y. Chen
Phys. Rev. E 71, 036410 – Published 24 March 2005

Abstract

The relativistic instabilities of electromagnetic ion cyclotron waves driven by MeV ions are analytically and numerically studied. As caused by wave magnetic field and in sharp contrast to the electrostatic case, interesting characteristics such as Alfvénic behavior and instability transition are discovered and illuminated in detail. The instabilities are reactive and are raised from the coupling of slow ions’ first-order resonance and fast ions’ second-order resonance, that is an essential extra mechanism due to relativistic effect. Because of the wave magnetic field, the nonresonant plasma dielectric is usually negative and large, that affects the instability conditions and scaling laws. A negative harmonic cyclotron frequency mismatch between the fast and slow ions is required for driving a cubic (and a coupled quadratic) instability; the cubic (square) root scaling of the peak growth rate makes the relativistic effect more important than classical mechanism, especially for low fast ion density and Lorentz factor being close to unity. For the cubic instability, there is a threshold (ceiling) on the slow ion temperature and density (the external magnetic field and the fast ion energy); the Alfvén velocity is required to be low. This Alfvénic behavior is interesting in physics and important for its applications. The case of fast protons in thermal deuterons is numerically studied and compared with the analytical results. When the slow ion temperature or density (the external magnetic field or the fast ion energy) is increased (reduced) to about twice (half) the threshold (ceiling), the same growth rate peak transits from the cubic instability to the coupled quadratic instability and a different cubic instability branch appears. The instability transition is an interesting new phenomenon for instability.

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  • Received 26 June 2004

DOI:https://doi.org/10.1103/PhysRevE.71.036410

©2005 American Physical Society

Authors & Affiliations

K. R. Chen*, R. D. Huang, J. C. Wang, and Y. Y. Chen

  • Department of Physics and Institute of Electro-Optical Science and Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China

  • *Electronic address: chenkr@mail.ncku.edu.tw

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Vol. 71, Iss. 3 — March 2005

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