Robust method to retrieve the constitutive effective parameters of metamaterials

Xudong Chen, Tomasz M. Grzegorczyk, Bae-Ian Wu, Joe Pacheco, Jr., and Jin Au Kong
Phys. Rev. E 70, 016608 – Published 26 July 2004

Abstract

We propose an improved method to retrieve the effective constitutive parameters (permittivity and permeability) of a slab of metamaterial from the measurement of S parameters. Improvements over existing methods include the determination of the first boundary and the thickness of the effective slab, the selection of the correct sign of effective impedance, and a mathematical method to choose the correct branch of the real part of the refractive index. The sensitivity of the effective constitutive parameters to the accuracy of the S parameters is also discussed. The method has been applied to various metamaterials and the successful retrieval results prove its effectiveness and robustness.

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  • Received 25 February 2004

DOI:https://doi.org/10.1103/PhysRevE.70.016608

©2004 American Physical Society

Authors & Affiliations

Xudong Chen, Tomasz M. Grzegorczyk, Bae-Ian Wu, Joe Pacheco, Jr., and Jin Au Kong

  • Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

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Issue

Vol. 70, Iss. 1 — July 2004

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